Journalartikel
Autorenliste: Yavor, MI; Berdnikov, AS; Wollnik, H
Jahr der Veröffentlichung: 1997
Seiten: 203-208
Zeitschrift: International journal of mass spectrometry and ion processes
Bandnummer: 171
Heftnummer: 1-3
ISSN: 1387-3806
DOI Link: https://doi.org/10.1016/S0168-1176(97)00124-9
Verlag: Elsevier Science
Overall beam distortions in multistage static mass analyzers are compared as they arise from defects in manufacturing of different types of elements. Possibilities of a correction are shown to be limited by second-order effects.
Abstract:
Zitierstile
Harvard-Zitierstil: Yavor, M., Berdnikov, A. and Wollnik, H. (1997) Beam distortions and their compensation in sector field mass spectrometers, International journal of mass spectrometry and ion processes, 171(1-3), pp. 203-208. https://doi.org/10.1016/S0168-1176(97)00124-9
APA-Zitierstil: Yavor, M., Berdnikov, A., & Wollnik, H. (1997). Beam distortions and their compensation in sector field mass spectrometers. International journal of mass spectrometry and ion processes. 171(1-3), 203-208. https://doi.org/10.1016/S0168-1176(97)00124-9
Schlagwörter
aberration; beam distortion; IMPERFECT; manufacturing defects; mass spectrometer; sector field
