Journal article

Beam distortions and their compensation in sector field mass spectrometers


Authors list: Yavor, MI; Berdnikov, AS; Wollnik, H

Publication year: 1997

Pages: 203-208

Journal: International journal of mass spectrometry and ion processes

Volume number: 171

Issue number: 1-3

ISSN: 1387-3806

DOI Link: https://doi.org/10.1016/S0168-1176(97)00124-9

Publisher: Elsevier Science


Abstract: 

Overall beam distortions in multistage static mass analyzers are compared as they arise from defects in manufacturing of different types of elements. Possibilities of a correction are shown to be limited by second-order effects.




Citation Styles

Harvard Citation style: Yavor, M., Berdnikov, A. and Wollnik, H. (1997) Beam distortions and their compensation in sector field mass spectrometers, International journal of mass spectrometry and ion processes, 171(1-3), pp. 203-208. https://doi.org/10.1016/S0168-1176(97)00124-9

APA Citation style: Yavor, M., Berdnikov, A., & Wollnik, H. (1997). Beam distortions and their compensation in sector field mass spectrometers. International journal of mass spectrometry and ion processes. 171(1-3), 203-208. https://doi.org/10.1016/S0168-1176(97)00124-9



Keywords

aberration; beam distortion; IMPERFECT; manufacturing defects; mass spectrometer; sector field

Last updated on 2025-21-05 at 18:46