Konferenzpaper

Thin Nd-Fe-B films analyzed by Lorentz and magnetic force microscopy


AutorenlisteLemke, H; Goddenhenrich, T; Heiden, C; Thomas, G

Jahr der Veröffentlichung1997

Seiten3865-3867

ZeitschriftIEEE Transactions on Magnetics

Bandnummer33

Heftnummer5

ISSN0018-9464

DOI Linkhttps://doi.org/10.1109/20.619597

Konferenz35th Annual IEEE International Magnetics Conference (INTERMAG 97)

VerlagInstitute of Electrical and Electronics Engineers


Abstract

The influence of nano sized crystal structure on the domain structure of Nd-Pe-B films has been analyzed by means of transmission electron and scanning force microscopy. For magnetic imaging these instruments have been operated in the Lorentz/MFM mode.

The samples have been prepared by pulsed laser deposition on carbon films with the substrates at about 625 degrees C. The multiphase composition of the films consists of the hard magnetic Nd2Fe14B phases as major phases and of soft magnetic phases such as Fe2B and alpha-Fe as well as Nd2O3. The crystalline structure produces circular magnetic domains with diameters on the order of 100 nm which are influenced by the grain structure. Most domains cover several grains. The use of Nd-Fe-B films for data storage is suggested.




Zitierstile

Harvard-ZitierstilLemke, H., Goddenhenrich, T., Heiden, C. and Thomas, G. (1997) Thin Nd-Fe-B films analyzed by Lorentz and magnetic force microscopy, IEEE Transactions on Magnetics, 33(5), pp. 3865-3867. https://doi.org/10.1109/20.619597

APA-ZitierstilLemke, H., Goddenhenrich, T., Heiden, C., & Thomas, G. (1997). Thin Nd-Fe-B films analyzed by Lorentz and magnetic force microscopy. IEEE Transactions on Magnetics. 33(5), 3865-3867. https://doi.org/10.1109/20.619597


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