Conference paper

Thin Nd-Fe-B films analyzed by Lorentz and magnetic force microscopy


Authors listLemke, H; Goddenhenrich, T; Heiden, C; Thomas, G

Publication year1997

Pages3865-3867

JournalIEEE Transactions on Magnetics

Volume number33

Issue number5

ISSN0018-9464

DOI Linkhttps://doi.org/10.1109/20.619597

Conference35th Annual IEEE International Magnetics Conference (INTERMAG 97)

PublisherInstitute of Electrical and Electronics Engineers


Abstract

The influence of nano sized crystal structure on the domain structure of Nd-Pe-B films has been analyzed by means of transmission electron and scanning force microscopy. For magnetic imaging these instruments have been operated in the Lorentz/MFM mode.

The samples have been prepared by pulsed laser deposition on carbon films with the substrates at about 625 degrees C. The multiphase composition of the films consists of the hard magnetic Nd2Fe14B phases as major phases and of soft magnetic phases such as Fe2B and alpha-Fe as well as Nd2O3. The crystalline structure produces circular magnetic domains with diameters on the order of 100 nm which are influenced by the grain structure. Most domains cover several grains. The use of Nd-Fe-B films for data storage is suggested.




Citation Styles

Harvard Citation styleLemke, H., Goddenhenrich, T., Heiden, C. and Thomas, G. (1997) Thin Nd-Fe-B films analyzed by Lorentz and magnetic force microscopy, IEEE Transactions on Magnetics, 33(5), pp. 3865-3867. https://doi.org/10.1109/20.619597

APA Citation styleLemke, H., Goddenhenrich, T., Heiden, C., & Thomas, G. (1997). Thin Nd-Fe-B films analyzed by Lorentz and magnetic force microscopy. IEEE Transactions on Magnetics. 33(5), 3865-3867. https://doi.org/10.1109/20.619597


Last updated on 2025-01-04 at 23:22