Accommodation in Ar(Kr, Xe) and metal-surface systems as a test for electronic dissipation - Research portal of Justus Liebig University Giessen:

Conference paper

Accommodation in Ar(Kr, Xe) and metal-surface systems as a test for electronic dissipation

Authors list: Bärwinkel, K; Schippers, S

Publication year: 1990

Pages: 396-398

Journal: Vacuum

Volume number: 41

Issue number: 1-3

ISSN: 0042-207X

DOI Link: https://doi.org/10.1016/0042-207X(90)90369-A

Conference: 11th International Vacuum Congress ( ICV-11 ), 7th International Conference on Solid Surfaces (ICSS-7)

Publisher: Elsevier

Abstract:

A reinterpretation of experimental results on energy accommodation for the gas-surface systems Ar single bond W, KrW, and XeW is provided in the frame of the scattering kernel formalism. A threshold velocity for trapping can be drawn from the analysis. This threshold is explained on the basis of charge transfer and electronic relaxation during scattering.

Authors/Editors

- apl.-Prof. Dr. habil. (F.A.P.S.) Stefan Ewald Schippers

Citation Styles

Harvard Citation style: Bärwinkel, K. and Schippers, S. (1990) Accommodation in Ar(Kr, Xe) and metal-surface systems as a test for electronic dissipation, Vacuum, 41(1-3), pp. 396-398. https://doi.org/10.1016/0042-207X(90)90369-A

APA Citation style: Bärwinkel, K., & Schippers, S. (1990). Accommodation in Ar(Kr, Xe) and metal-surface systems as a test for electronic dissipation. Vacuum. 41(1-3), 396-398. https://doi.org/10.1016/0042-207X(90)90369-A