Konferenzpaper

Jahr der Veröffentlichung: 2014

Zeitschrift: Journal of Physics: Conference Series

Bandnummer: 488

DOI Link: https://doi.org/10.1088/1742-6596/488/6/062025

Konferenz: 28th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2013)

Verlag: IOP Publishing: Conference Series

Abstract: 

Electron-impact single ionization of xenon and tin ions for charge states where the 4d-subshell is the outermost has been investigated. Measured cross sections have been analyzed in detail by comparing with configuration-averaged distorted wave (CAWD) calculations. Contributions of different direct- and indirect ionization processes have thus been quantitatively revealed.

Harvard-Zitierstil: Borovik, A., Gharaibeh, M., Rausch, J., Rudolph, J., Hillenbrand, P., Schippers, S., et al. (2014) Electron-impact ionization of 4d-shell xenon and tin ions, Journal of Physics: Conference Series, 488, Article 062025. https://doi.org/10.1088/1742-6596/488/6/062025

APA-Zitierstil: Borovik, A., Gharaibeh, M., Rausch, J., Rudolph, J., Hillenbrand, P., Schippers, S., & Müller, A. (2014). Electron-impact ionization of 4d-shell xenon and tin ions. Journal of Physics: Conference Series. 488, Article 062025. https://doi.org/10.1088/1742-6596/488/6/062025