Conference paper
Authors list: Borovik, A; Gharaibeh, MF; Rausch, J; Rudolph, J; Hillenbrand, PM; Schippers, S; Müller, A
Publication year: 2014
Journal: Journal of Physics: Conference Series
Volume number: 488
DOI Link: https://doi.org/10.1088/1742-6596/488/6/062025
Conference: 28th International Conference on Photonic, Electronic and Atomic Collisions (ICPEAC 2013)
Publisher: IOP Publishing: Conference Series
Electron-impact single ionization of xenon and tin ions for charge states where the 4d-subshell is the outermost has been investigated. Measured cross sections have been analyzed in detail by comparing with configuration-averaged distorted wave (CAWD) calculations. Contributions of different direct- and indirect ionization processes have thus been quantitatively revealed.
Abstract:
Citation Styles
Harvard Citation style: Borovik, A., Gharaibeh, M., Rausch, J., Rudolph, J., Hillenbrand, P., Schippers, S., et al. (2014) Electron-impact ionization of 4d-shell xenon and tin ions, Journal of Physics: Conference Series, 488, Article 062025. https://doi.org/10.1088/1742-6596/488/6/062025
APA Citation style: Borovik, A., Gharaibeh, M., Rausch, J., Rudolph, J., Hillenbrand, P., Schippers, S., & Müller, A. (2014). Electron-impact ionization of 4d-shell xenon and tin ions. Journal of Physics: Conference Series. 488, Article 062025. https://doi.org/10.1088/1742-6596/488/6/062025
