Journal article
Authors list: Ahmed, S.; Pokle, A.; Belz, J.; Bianchini, M.; Beyer, A.; Janek, J.; Volz, K.
Publication year: 2021
Pages: 1446-1449
Journal: Microscopy and Microanalysis
Volume number: 27
Issue number: S1
DOI Link: https://doi.org/10.1017/S1431927621005353
Publisher: Oxford University Press
Citation Styles
Harvard Citation style: Ahmed, S., Pokle, A., Belz, J., Bianchini, M., Beyer, A., Janek, J., et al. (2021) A robust technique to image all elements in LiNiO2 cathode active material by 4D-STEM, Microscopy and Microanalysis, 27(S1), pp. 1446-1449. https://doi.org/10.1017/S1431927621005353
APA Citation style: Ahmed, S., Pokle, A., Belz, J., Bianchini, M., Beyer, A., Janek, J., & Volz, K. (2021). A robust technique to image all elements in LiNiO2 cathode active material by 4D-STEM. Microscopy and Microanalysis. 27(S1), 1446-1449. https://doi.org/10.1017/S1431927621005353